Assessing the genetic potential of the early generation families of white yam (Dioscorea rotundata) for growth and yield traits became this study’s aim. The experiment began in 2021 at the Njala Agricultural Research Centre (NARC), Njala, Sierra Leone. The results revealed the yam families significantly (P < 0.05) varied for days to first emergence (DAYFE), days to 50% emergence (DAYSE), germination index (GI), seedling vigor index (SVI), and the number of tubers per plant. The Family TDr190016 germinated earliest (14.5 days); however, families TDr190053 and TDr190113 exhibited the longest germination period (> 20 days). Traits with high phenotypic (PCV) and genotypic coefficient of variation (GCV) were germination index, seedling vigor index, percent seed emergence at 21 and 28 days after sowing, and pooled percent seed emergence (PSE). Broad sense heritability (HB) values ranged between 21.5% (pooled PSE) and 92.1% (SVI). Traits with the high broad sense heritability were days to 50% emergence (83.2%), germination index (74.6%), seedling vigor index (92.1%), percent seed emergence at 21 days (80.0%), and percent seed emergence at 28 days (62.8%). The yam families revealed the higher genetic advance for almost all traits except days to first emergence. In terms of various traits, the genetic effects of the early generation white yam families contributed more to the total phenotypic variability than the non-genetic effects, requiring more exploration for breeding.
White yam (Dioscorea rotundata), progeny families, seed germination, growth and yield traits, genetic parameters
Significant variation exists among the early generation families of white yam (Dioscorea rotundata) for growth and yield traits. Genetic effects of the early generation white yams contribute more than the non-genetic effects to the total phenotypic variability.